|The instrument is calibrated for a wide range of elements including F, Na, Mg, Al, Si, P, S, Cl, K, Ca, Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, As, Rb, Sr, Y,Zr, Nb, Mo, Cd, Sn, Sb, Cs, Ba, La, Ce, Pr, Nd, Sm, Eu, Hf, Ta, W, Pb, Bi, Th and U. Most recent work has focused on feature relocation. Several techniques have been evaluated to locate minerals in polished thin sections prior to microprobe analysis. The techniques under consideration include beta autoradiography, X-ray excited optical luminescence and uv excited optical luminescence. Specific mineral(s) respond to each of these techniques enabling their rapid relocation prior to probe analysis. This work has resulted in the development of a computer-based relocation procedure in which a digital image of the sample is used as a ‘map’ to relocate visible features on the sample mounted on the microprobe specimen stage. Much of the work is on silicate, oxide and sulphide minerals.|
For no-destructive quantitative chemical analysis and imaging of micron-sized material. The Cameca SX100 operates from a SUN workstation running Solaris 2 and is driven with proprietary software developed by Cameca. Modules include Qualitative Analysis, Quantitative Analysis and Image Capture (including X-ray mapping).